| 7437531 |
Testing memories |
Michael R. Spica, Md Rezwanur Rahman |
2008-10-14 |
| 6754867 |
Method of determining non-accessible device I/O pin speed using on chip LFSR and MISR as data source and results analyzer respectively |
Ajay Ojha |
2004-06-22 |
| 6311295 |
System and method for testing a clock signal |
Humberto Felipe Casal, David M. Wu |
2001-10-30 |
| 6161208 |
Storage subsystem including an error correcting cache and means for performing memory to memory transfers |
Patrick F. Dutton, Steven Lee Gregor |
2000-12-12 |
| 6023778 |
Method and apparatus for utilizing mux scan flip-flops to test speed related defects by delaying an active to inactive transition of a scan mode signal |
— |
2000-02-08 |
| 5917356 |
Three state phase detector |
Humberto Felipe Casal, Trong D. Nguyen |
1999-06-29 |
| 5822596 |
Controlling power up using clock gating |
Humberto Felipe Casal, Trong D. Nguyen, Nandor G. Thoma |
1998-10-13 |
| 5619158 |
Hierarchical clocking system using adaptive feedback |
Humberto Felipe Casal, Joel Roger Davidson, Yuan-Chang Lo, Trong D. Nguyen, Campbell H. Snyder +1 more |
1997-04-08 |
| 5613157 |
Address range extension for a modular computer |
Joel Roger Davidson, Franklin Liu |
1997-03-18 |
| 5581699 |
System and method for testing a clock signal |
Humberto Felipe Casal, David M. Wu |
1996-12-03 |
| 5121500 |
Preliminary polling for identification and location of removable/replaceable computer components prior to power-up |
David L. Arlington, Jacqueline K. Morris, Jerry K. Radcliffe |
1992-06-09 |
| 4888773 |
Smart memory card architecture and interface |
David L. Arlington, Jacqueline M. Cole, Bruce G. Hazelzet, David J. Krolak, Bharat J. Oza +1 more |
1989-12-19 |
