| 7008852 |
Discontinuous dielectric interface for bipolar transistors |
Arne Ballantine, Douglas D. Coolbaugh, Jeffrey D. Gilbert, Joseph R. Greco |
2006-03-07 |
| 6939771 |
Discontinuous dielectric interface for bipolar transistors |
Arne Ballantine, Douglas D. Coolbaugh, Jeffrey D. Gilbert, Joseph R. Greco |
2005-09-06 |
| 6822311 |
DC or AC electric field assisted anneal |
Arne Ballantine, John J. Ellis-Monaghan, Toshihura Furukawa, Jeffrey D. Gilbert, James A. Slinkman |
2004-11-23 |
| 6703283 |
Discontinuous dielectric interface for bipolar transistors |
Arne Ballantine, Douglas D. Coolbaugh, Jeffrey D. Gilbert, Joseph R. Greco |
2004-03-09 |
| 6638629 |
Semiconductor temperature monitor |
Donna K. Johnson, Jerome B. Lasky |
2003-10-28 |
| 6552411 |
DC or AC electric field assisted anneal |
Arne Ballantine, John J. Ellis-Monaghan, Toshihura Furukawa, Jeffrey D. Gilbert, James A. Slinkman |
2003-04-22 |
| 6472232 |
Semiconductor temperature monitor |
Donna K. Johnson, Jerome B. Lasky |
2002-10-29 |
| 6339022 |
Method of annealing copper metallurgy |
Arne Ballantine, Edward C. Cooney, III, George A. Dunbar, III, Cheryl G. Faltermeier, Jeffrey D. Gilbert +9 more |
2002-01-15 |
| 6274465 |
DC electric field assisted anneal |
Arne Ballantine, John J. Ellis-Monaghan, Toshiharu Furukawa, James A. Slinkman |
2001-08-14 |
| 6255185 |
Two step anneal for controlling resistor tolerance |
Douglas D. Coolbaugh, Sophia Maumovna Ratenberg |
2001-07-03 |
