| 5150392 |
X-ray mask containing a cantilevered tip for gap control and alignment |
Mark A. McCord |
1992-09-22 |
| 5057773 |
Method for opens/shorts testing of capacitively coupled networks in substrates using electron beams |
Steven D. Golladay, David Hutson, William Daniel Meisburger, Juergen Rasch |
1991-10-15 |
| 4943769 |
Apparatus and method for opens/shorts testing of capacitively coupled networks in substrates using electron beams |
Steven D. Golladay, David Hutson, William Daniel Meisburger, Juergen Rasch |
1990-07-24 |
| 4871919 |
Electron beam lithography alignment using electric field changes to achieve registration |
Thomas P. Donohue, George A. Sai-Halasz |
1989-10-03 |
| 4843330 |
Electron beam contactless testing system with grid bias switching |
Steven D. Golladay, Hans C. Pfeiffer |
1989-06-27 |
| 4621232 |
Inspection of unsintered single layer or multilayer ceramics using a broad area electrical contacting structure |
Tai-Hon Philip Chang, Philip J. Coane, Walter W. Molzen, Jr., Arthur R. Zingher |
1986-11-04 |
| 4486684 |
Single crystal lanthanum hexaboride electron beam emitter having high brightness |
— |
1984-12-04 |
| 4468586 |
Shaped electron emission from single crystal lanthanum hexaboride with intensity distribution |
— |
1984-08-28 |
| 4426583 |
Electron beam potential switching apparatus |
Tai-Hon Philip Chang, Phillip J. Coane, Dieter Kern |
1984-01-17 |
