Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5111141 | Magnetic field measurement optimization apparatus using a charged particle beam | Satoru Fukuhara, Hiroyuki Shinada | 1992-05-05 |
| 5093616 | Voltage measurement method using electron beam | Hideo Todokoro, Satoru Fukuhara, Hiroyuki Shinada | 1992-03-03 |
| 4922097 | Potential measurement device | Hideo Todokoro, Hiroyuki Shinada | 1990-05-01 |
| 4605860 | Apparatus for focusing a charged particle beam onto a specimen | Satoru Fukuhara, Mikio Ichihashi, Hisaya Murakoshi | 1986-08-12 |