Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5173719 | Method and apparatus for the inspection of patterns | Yuzo Taniguchi, Tooru Fukui, Yoshiichi Hori, Takahiro Kamagata | 1992-12-22 |
| 4731855 | Pattern defect inspection apparatus | Kyo Suda, Shigeharu Kimura, Shinobu Hase, Chusuke Munakata, Kanji Kinameri +3 more | 1988-03-15 |