Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7036060 | Semiconductor integrated circuit and its analyzing method | Michinobu Nakao, Ryo Yamagata, Seiji Kobayashi, Kazunori Hikone, Kotaro Shimamura | 2006-04-25 |
| 6922803 | Test method of semiconductor intergrated circuit and test pattern generator | Michinobu Nakao, Koichiro Natsume, Yoshikazu Kiyoshige, Masaki Kouno, Masato Hamamoto +2 more | 2005-07-26 |
| 6640198 | Semiconductor device having self test function | Masahide Miyazaki, Kazunori Hikone, Seiji Kobayashi | 2003-10-28 |
| 6484294 | Semiconductor integrated circuit and method of designing the same | Yoshikazu Kiyoshige, Michinobu Nakao, Takashi Hotta | 2002-11-19 |
| 6317853 | Apparatus for making test data and method thereof | Kazunori Hikone, Takao Nishida, Hiromichi Yamada | 2001-11-13 |
| 6038691 | Method of analyzing logic circuit test points, apparatus for analyzing logic circuit test points and semiconductor integrated circuit with test points | Michinobu Nakao, Jun Hirano | 2000-03-14 |
| 5329532 | Logic circuit with additional circuit for carrying out delay test | Mitsuji Ikeda, Terumine Hayashi | 1994-07-12 |
| 4956818 | Memory incorporating logic LSI and method for testing the same LSI | Terumine Hayashi | 1990-09-11 |
| 4710930 | Method and apparatus for diagnosing a LSI chip | Terumine Hayashi | 1987-12-01 |
| 4613970 | Integrated circuit device and method of diagnosing the same | Ikuro Masuda, Hideo Maejima, Terumine Hayashi | 1986-09-23 |