Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8400853 | Semiconductor chip and method of repair design of the same | Chizu Matsumoto, Kaname Yamasaki, Yoshikazu Saitou | 2013-03-19 |
| 7983858 | Fault test apparatus and method for testing semiconductor device under test using fault excitation function | Yuzo Takamatsu, Hiroshi Takahashi, Yoshinobu Higami, Takashi Aikyo, Michiaki Emori +1 more | 2011-07-19 |
| 7036060 | Semiconductor integrated circuit and its analyzing method | Ryo Yamagata, Kazumi Hatayama, Seiji Kobayashi, Kazunori Hikone, Kotaro Shimamura | 2006-04-25 |
| 6922803 | Test method of semiconductor intergrated circuit and test pattern generator | Kazumi Hatayama, Koichiro Natsume, Yoshikazu Kiyoshige, Masaki Kouno, Masato Hamamoto +2 more | 2005-07-26 |
| 6484294 | Semiconductor integrated circuit and method of designing the same | Yoshikazu Kiyoshige, Kazumi Hatayama, Takashi Hotta | 2002-11-19 |
| 6038691 | Method of analyzing logic circuit test points, apparatus for analyzing logic circuit test points and semiconductor integrated circuit with test points | Kazumi Hatayama, Jun Hirano | 2000-03-14 |