Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7983858 | Fault test apparatus and method for testing semiconductor device under test using fault excitation function | Yuzo Takamatsu, Hiroshi Takahashi, Yoshinobu Higami, Michinobu Nakao, Takashi Aikyo +1 more | 2011-07-19 |