Issued Patents All Time
Showing 26–28 of 28 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6334097 | Method of determining lethality of defects in circuit pattern inspection method of selecting defects to be reviewed and inspection system of circuit patterns involved with the methods | Yasuhiro Yoshitake, Masataka Shiba | 2001-12-25 |
| 5719084 | Method for the controlled formation of voids in doped glass dielectric films | Thomas G. Mallon, Chi-Yi Kao, Wei-Jen Hsia | 1998-02-17 |
| 5278103 | Method for the controlled formation of voids in doped glass dielectric films | Thomas G. Mallon, Chi-Yi Kao, Wei-Jen Hsia | 1994-01-11 |