Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8788981 | Method of OPC model building, information-processing apparatus, and method of determining process conditions of semiconductor device | Kyoungmo Yang, Shigeki Sukegawa, Takumichi Sutani | 2014-07-22 |
| 8581187 | Method for measuring sample and measurement device | Shunsuke Koshihara, Hitoshi Komuro, Ryoichi Matsuoka | 2013-11-12 |