Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7385196 | Method and scanning electron microscope for measuring width of material on sample | Goroku Shimoma, Tadashi Otaka, Mitsugu Sato, Hideo Todokoro, Shunichi Watanabe +3 more | 2008-06-10 |
| 6791084 | Method and scanning electron microscope for measuring dimension of material on sample | Goroku Shimoma, Tadashi Otaka, Mitsugu Sato, Hideo Todokoro, Shunichi Watanabe +3 more | 2004-09-14 |