Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10381260 | Method of manufacturing high resistivity semiconductor-on-insulator wafers with charge trapping layers | Igor Peidous, Jeffrey L. Libbert, Srikanth Kommu, Andrew M. Jones, Samuel Christopher Pratt +2 more | 2019-08-13 |
| 10381261 | Method of manufacturing high resistivity semiconductor-on-insulator wafers with charge trapping layers | Igor Peidous, Jeffrey L. Libbert, Srikanth Kommu, Andrew M. Jones, Samuel Christopher Pratt +2 more | 2019-08-13 |
| 6649883 | Method of calibrating a semiconductor wafer drying apparatus | Yoshio Iwamoto, James C. Lenk, Philip Schmidt, Craig Spohr | 2003-11-18 |
| 5592295 | Apparatus and method for semiconductor wafer edge inspection | Kenneth Krause | 1997-01-07 |