JL

James C. Lenk

MM Memc Electronic Materials: 2 patents #85 of 273Top 35%
Overall (All Time): #2,208,017 of 4,157,543Top 55%
2
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
6649883 Method of calibrating a semiconductor wafer drying apparatus Yoshio Iwamoto, Philip Schmidt, Craig Spohr, Leslie George Stanton 2003-11-18
5894711 Box handling apparatus and method James Paul Davidson, Andrew Lunday, Gordon P. Hampton, Gary L. Anderson, Larry W. Shive 1999-04-20