Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6649883 | Method of calibrating a semiconductor wafer drying apparatus | Yoshio Iwamoto, James C. Lenk, Craig Spohr, Leslie George Stanton | 2003-11-18 |
| 6318389 | Apparatus for cleaning semiconductor wafers | Jon Seilkop, Craig Spohr | 2001-11-20 |
| 6210640 | Collector for an automated on-line bath analysis system | Kenneth Ruth | 2001-04-03 |