Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9087803 | Methods of testing integrated circuit devices using fuse elements | Jeong Hoon Ahn, Hyun Choi | 2015-07-21 |
| 8450212 | Method of reducing critical dimension process bias differences between narrow and wide damascene wires | Matthew S. Angyal, Hakeem B. S. Akinmade-Yusuff | 2013-05-28 |
| 7348786 | Probe module for testing chips with electrical and optical input/output interconnects, methods of use, and methods of fabrication | Hiren D. Thacker, James D. Meindl | 2008-03-25 |
| 7099528 | Methods and devices for coupling electromagnetic radiation using diffractive optical elements | Alan F. Benner | 2006-08-29 |