WL

Warren Lin

GS General Scanning: 4 patents #10 of 50Top 20%
SC Speedfam Co.: 3 patents #15 of 105Top 15%
NI Nanometrics Incorporated: 2 patents #40 of 127Top 35%
SP Speedfam-Ipec: 2 patents #50 of 143Top 35%
GL Gsi Lumonics: 1 patents #27 of 65Top 45%
TG The Gsi Group: 1 patents #90 of 181Top 50%
Overall (All Time): #301,274 of 4,157,543Top 8%
16
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
7568560 Center mount two piece brake rotor 2009-08-04
7219777 Reinforced brake rotor 2007-05-22
7199882 Method and system for high speed measuring of microscopic targets Donald J. Svetkoff, Donald B. T. Kilgus, Jonathan S. Ehrmann 2007-04-03
7097007 Vented slot brake rotor 2006-08-29
6750974 Method and system for 3D imaging of target regions Donald J. Svetkoff, Donald B. T. Kilgus, Jonathan S. Ehrmann 2004-06-15
6366357 Method and system for high speed measuring of microscopic targets Donald J. Svetkoff, Donald B. T. Kilgus, Jonathan S. Ehrmann 2002-04-02
6249347 Method and system for high speed measuring of microscopic targets Donald J. Svetkoff, Donald B. T. Kilgus, Jonathan S. Ehrmann 2001-06-19
6181425 Method and system for high speed measuring of microscopic targets Donald J. Svetkoff, Donald B. T. Kilgus, Jonathan S. Ehrmann 2001-01-30
6177998 Method and system for high speed measuring of microscopic targets Donald J. Svetkoff, Donald B. T. Kilgus, Jonathan S. Ehrmann 2001-01-23
5993289 Methods for the in-process detection of workpieces in a CMP environment Robert F. Allen, Paul Holzapfel, Anthony L. Bartels 1999-11-30
5961369 Methods for the in-process detection of workpieces with a monochromatic light source Anthony L. Bartels, Robert F. Allen, Paul Holzapfel 1999-10-05
5872633 Methods and apparatus for detecting removal of thin film layers during planarization Paul Holzapfel, James C. Schlueter, Chris Karlsrud 1999-02-16
5823853 Apparatus for the in-process detection of workpieces with a monochromatic light source Anthony L. Bartels, Robert F. Allen, Paul Holzapfel 1998-10-20
5733171 Apparatus for the in-process detection of workpieces in a CMP environment Robert F. Allen, Paul Holzapfel, Anthony L. Bartels 1998-03-31
5164857 Wide band non-coated beam splitter 1992-11-17
4826321 Thin dielectric film measuring system Vincent J. Coates 1989-05-02