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Warren Lin — 16 Patents

GSGeneral Scanning: 4 patents #10 of 50Top 20%
SCSpeedfam Co.: 3 patents #15 of 105Top 15%
NINanometrics Incorporated: 2 patents #40 of 127Top 35%
SPSpeedfam-Ipec: 2 patents #50 of 143Top 35%
GLGsi Lumonics: 1 patents #27 of 65Top 45%
TGThe Gsi Group: 1 patents #90 of 181Top 50%
Fremont, CA: #1,079 of 9,298 inventorsTop 15%
California: #37,952 of 386,348 inventorsTop 10%
Overall (All Time): #284,196 of 4,157,543Top 7%
16 Patents All Time
Warren Lin has been granted 16 US patents while listed as an inventor at General Scanning. The first was granted in 1989 and the most recent in August 2009. Warren Lin ranks #284,196 of 4,157,543 US inventors in our database (top 6.8%). Patent records list Warren Lin in Fremont, CA, US.

Patents per Year

Patents granted per year, 1989 to 2009Bar chart with a peak of 3 patents in 1999.peak 31989: 1 patents19891992: 1 patents19921998: 2 patents19981999: 3 patents19992001: 3 patents20012002: 1 patents20022004: 1 patents20042006: 1 patents20062007: 2 patents20072009: 1 patents2009

Issued Patents All Time

Showing 1–16 of 16 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
7568560 Center mount two piece brake rotor — 2009-08-04
7219777 Reinforced brake rotor — 2007-05-22
7199882 Method and system for high speed measuring of microscopic targets Donald J. Svetkoff, Donald B. T. Kilgus, Jonathan S. Ehrmann 2007-04-03 $1,446,000
7097007 Vented slot brake rotor — 2006-08-29
6750974 Method and system for 3D imaging of target regions Donald J. Svetkoff, Donald B. T. Kilgus, Jonathan S. Ehrmann 2004-06-15 $2,005,000
6366357 Method and system for high speed measuring of microscopic targets Donald J. Svetkoff, Donald B. T. Kilgus, Jonathan S. Ehrmann 2002-04-02 $6,374,000
6249347 Method and system for high speed measuring of microscopic targets Donald J. Svetkoff, Donald B. T. Kilgus, Jonathan S. Ehrmann 2001-06-19 $7,009,000
6181425 Method and system for high speed measuring of microscopic targets Donald J. Svetkoff, Donald B. T. Kilgus, Jonathan S. Ehrmann 2001-01-30 $5,652,000
6177998 Method and system for high speed measuring of microscopic targets Donald J. Svetkoff, Donald B. T. Kilgus, Jonathan S. Ehrmann 2001-01-23 $10,573,000
5993289 Methods for the in-process detection of workpieces in a CMP environment Robert F. Allen, Paul Holzapfel, Anthony L. Bartels 1999-11-30 $7,172,000
5961369 Methods for the in-process detection of workpieces with a monochromatic light source Anthony L. Bartels, Robert F. Allen, Paul Holzapfel 1999-10-05 $7,456,000
5872633 Methods and apparatus for detecting removal of thin film layers during planarization Paul Holzapfel, James C. Schlueter, Chris Karlsrud 1999-02-16 $2,602,000
5823853 Apparatus for the in-process detection of workpieces with a monochromatic light source Anthony L. Bartels, Robert F. Allen, Paul Holzapfel 1998-10-20 $3,794,000
5733171 Apparatus for the in-process detection of workpieces in a CMP environment Robert F. Allen, Paul Holzapfel, Anthony L. Bartels 1998-03-31 $7,693,000
5164857 Wide band non-coated beam splitter — 1992-11-17 $215,000
4826321 Thin dielectric film measuring system Vincent J. Coates 1989-05-02 $500,000

Frequent Collaborators

Donald B. T. Kilgus6 shared
Donald J. Svetkoff6 shared
Jonathan S. Ehrmann6 shared
Paul Holzapfel5 shared
Anthony L. Bartels4 shared
Robert F. Allen4 shared

Nearby-Ranked Inventors

Chung-Lin Fu16
Tyrone T. Chen16
Shivendra Katiyar16
Kevin E. Kalajan16
Henry Y. Mark16
Marco Becker16
Nak Gi Sung16
Kenta Iwai16
Brock Mammoser16