Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7466466 | Optical scanning method and system and method for correcting optical aberrations introduced into the system by a beam deflector | Jonathan S. Ehrmann | 2008-12-16 |
| 7199882 | Method and system for high speed measuring of microscopic targets | Donald J. Svetkoff, Warren Lin, Jonathan S. Ehrmann | 2007-04-03 |
| 6750974 | Method and system for 3D imaging of target regions | Donald J. Svetkoff, Warren Lin, Jonathan S. Ehrmann | 2004-06-15 |
| 6452686 | Method and system for high speed measuring of microscopic targets | Donald J. Svetkoff, Jonathan S. Ehrmann | 2002-09-17 |
| 6366357 | Method and system for high speed measuring of microscopic targets | Donald J. Svetkoff, Warren Lin, Jonathan S. Ehrmann | 2002-04-02 |
| 6249347 | Method and system for high speed measuring of microscopic targets | Donald J. Svetkoff, Warren Lin, Jonathan S. Ehrmann | 2001-06-19 |
| 6181425 | Method and system for high speed measuring of microscopic targets | Donald J. Svetkoff, Warren Lin, Jonathan S. Ehrmann | 2001-01-30 |
| 6177998 | Method and system for high speed measuring of microscopic targets | Donald J. Svetkoff, Warren Lin, Jonathan S. Ehrmann | 2001-01-23 |
| 6098031 | Versatile method and system for high speed, 3D imaging of microscopic targets | Donald J. Svetkoff | 2000-08-01 |
| 6028671 | Method and system for suppressing unwanted reflections in an optical system | Donald J. Svetkoff | 2000-02-22 |
| 5822486 | Scanned remote imaging method and system and method of determining optimum design characteristics of a filter for use therein | Donald J. Svetkoff | 1998-10-13 |
| 5768461 | Scanned remote imaging method and system and method of determining optimum design characteristics of a filter for use therein | Donald J. Svetkoff | 1998-06-16 |