Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| RE34783 | Method for determining absolute reflectance of a material in the ultraviolet range | — | 1994-11-08 |
| 5045704 | Method for determining absolute reflectance of a material in the ultraviolet range | — | 1991-09-03 |
| 4884890 | Method for normalizing the detection signals of magnified images of fluorescing materials | — | 1989-12-05 |
| 4849694 | Thickness measurements of thin conductive films | — | 1989-07-18 |
| 4826321 | Thin dielectric film measuring system | Warren Lin | 1989-05-02 |
| 4743757 | Secondary electron emission control in electron microscopes | — | 1988-05-10 |
| 4596929 | Three-stage secondary emission electron detection in electron microscopes | Duane C. Holmes, Guillermo L. Toro-Lira | 1986-06-24 |
| 4521686 | Linewidth measuring with linearity calibration of the T.V. camera tube | J. Evan Grund, Stephen B. Westrate | 1985-06-04 |
| 4373817 | Computerized micromeasuring system and method therefor | — | 1983-02-15 |
| 4308586 | Method for the precise determination of photoresist exposure time | — | 1981-12-29 |