Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7012583 | Apparatus and method for testing pixels of flat panel display | David S. Baker | 2006-03-14 |
| 6987400 | Testing flat panel display plates using high frequency AC signals | — | 2006-01-17 |
| 6873175 | Apparatus and method for testing pixels arranged in a matrix array | Makoto Shinohara, Takaharu Nishihara | 2005-03-29 |
| 6075245 | High speed electron beam based system for testing large area flat panel displays | — | 2000-06-13 |
| 6033281 | System for testing field emission flat panel displays | — | 2000-03-07 |
| 6000905 | High speed in-vacuum flat panel display handler | — | 1999-12-14 |
| 5982190 | Method to determine pixel condition on flat panel displays using an electron beam | — | 1999-11-09 |
| 5493116 | Detection system for precision measurements and high resolution inspection of high aspect ratio structures using particle beam devices | Alan H. Achilles, Nolan V. Frederick, Kevin M. Monahan, Philip R. Rigg | 1996-02-20 |
| 5332898 | Precision measurement using particle beam devices | Robert Zmrzli | 1994-07-26 |
| 5176493 | High speed wafer handling method | Alan C. Abel, Alan H. Achilles | 1993-01-05 |
| 5098245 | High speed wafer handler | Alan C. Abel, Alan H. Achilles | 1992-03-24 |
| 4627009 | Microscope stage assembly and control system | Duane C. Holmes | 1986-12-02 |
| 4596929 | Three-stage secondary emission electron detection in electron microscopes | Vincent J. Coates, Duane C. Holmes | 1986-06-24 |