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USPTO Patent Rankings Data through Dec 31, 2025
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Curtis Wayne Rose — 17 Patents

GE: 17 patents #1,729 of 36,430Top 5%
Mechanicville, NY: #16 of 102 inventorsTop 20%
New York: #8,526 of 115,490 inventorsTop 8%
Overall (All Time): #263,971 of 4,157,543Top 7%
17 Patents All Time
Curtis Wayne Rose has been granted 17 US patents while listed as an inventor at GE. The first was granted in 2002 and the most recent in December 2018. Curtis Wayne Rose ranks #263,971 of 4,157,543 US inventors in our database (top 6.3%). Patent records list Curtis Wayne Rose in Mechanicville, NY, US.

Issued Patents All Time

Showing 1–17 of 17 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
10161910 Methods of non-destructive testing and ultrasonic inspection of composite materials Ehsan DEHGHAN NIRI, Amir Riahi, Eric Michael Shain 2018-12-25
9976989 Monitoring systems and methods for electrical machines Ehsan DEHGHAN NIRI, Andrew Batton Witney 2018-05-22 $17,738,000
9879989 Methods and systems for inspecting a wind turbine blade Gary Austin Lamberton 2018-01-30 $18,710,000
9689262 Thermographic inspection system for composite wind turbine blade Gary Austin Lamberton 2017-06-27 $15,934,000
9255860 Immersion inspection system for a machine and related method of operation Gary Austin Lamberton 2016-02-09 $27,679,000
8706436 Manufacture of engineering components with designed defects for analysis of production components John Broddus Deaton, Jr. 2014-04-22 $15,916,000
8235663 Article and ultrasonic inspection method and system therefor Robert V. Falsetti, Gary Austin Lamberton 2012-08-07 $21,386,000
7750643 Process and system for detecting surface anomalies 2010-07-06 $30,276,000
7017414 Ultrasonic inspection method and system therefor Robert V. Falsetti 2006-03-28 $26,986,000
6911826 Pulsed eddy current sensor probes and inspection methods Yuri Alexeyevich Plotnikov, Thomas James Batzinger, Shridhar Champaknath Nath, Sandeep Kumar Dewangan, Carl Lester +1 more 2005-06-28 $40,470,000
6888347 Omnidirectional eddy current probes, array probes, and inspection systems Thomas James Batzinger, Shridhar Champaknath Nath 2005-05-03 $24,103,000
6812697 Molded eddy current array probe William Stewart McKnight, Shridhar Champaknath Nath, Sandie Elizabeth Gresham, Richard L. Trantow, Douglas Ingram +3 more 2004-11-02 $64,284,000
6720775 Pulsed eddy current two-dimensional sensor array inspection probe and system Yuri Alexeyevich Plotnikov, Shridhar Champaknath Nath, Thomas James Batzinger, Kenneth G. Herd 2004-04-13 $54,054,000
6707297 Method for in-situ eddy current inspection of coated components in turbine engines Shridhar Champaknath Nath, Thomas James Batzinger, Yuri Alexeyevich Plotnikov, Kenneth G. Herd 2004-03-16 $35,568,000
6670808 Self reference eddy current probe, measurement system, and measurement method Shridhar Champaknath Nath, Carl Lester, Thomas James Batzinger 2003-12-30 $42,246,000
6545467 Contoured surface eddy current inspection system Thomas James Batzinger, James P. Fulton, Lee C. Perocchi 2003-04-08 $63,517,000
6414483 Eddy current inspection method and apparatus for detecting flaws in an electrically conductive component Shridhar Champaknath Nath, Thomas James Batzinger, Paul Stryjek 2002-07-02 $37,392,000