| 6545467 |
Contoured surface eddy current inspection system |
Thomas James Batzinger, Curtis Wayne Rose, Lee C. Perocchi |
2003-04-08 |
| 6215379 |
Shunt for indirectly heated bimetallic strip |
Thomas J. O'Keefe, Alan Luis Arvidson |
2001-04-10 |
| 6054210 |
Molded magnetic article |
Robert G. Bryant, Min Namkung, Russell A. Wincheski, Robert L. Fox |
2000-04-25 |
| 6029530 |
Finger controlled inspection apparatus |
Thadd Clark Patton, Robert John Filkins, Kristina Helena Valborg Hedengren, John D. Young |
2000-02-29 |
| 5942894 |
Radially focused eddy current sensor for detection of longitudinal flaws in metallic tubes |
Russell A. Wincheski, John W. Simpson, Shridhar Champaknath Nath, Ronald G. Todhunter, Min Namkung |
1999-08-24 |
| 5895871 |
Finger controlled inspection apparatus |
Thadd Clark Patton, Robert John Filkins, Kristina Helena Valborg Hedengren, John D. Young |
1999-04-20 |
| 5847562 |
Thickness gauging of single-layer conductive materials with two-point non linear calibration algorithm |
Min Namkung, John W. Simpson, Russell A. Wincheski, Shridhar Champaknath Nath |
1998-12-08 |
| 5801532 |
Hand-holdable eddy-current probe |
Thadd Clark Patton, Robert John Filkins, Kristina Helena Valborg Hedengren, John D. Young |
1998-09-01 |
| 5698977 |
Eddy current method for fatigue testing |
John W. Simpson, Russell A. Wincheski, Ronald G. Todhunter, Min Namkung, Shridhar Champaknath Nath |
1997-12-16 |
| 5648721 |
Rotating flux-focusing eddy current probe for flaw detection |
Russell A. Wincheski, Shridhar Champaknath Nath, John W. Simpson, Min Namkung |
1997-07-15 |
| 5617024 |
Flux focusing eddy current probe |
John W. Simpson, C. Gerald Clendenin, Russell A. Wincheski, Ronald G. Todhunter, Min Namkung +1 more |
1997-04-01 |
| 5493511 |
High speed thin plate fatigue crack monitor |
Buzz A. Wincheski, Joseph S. Heyman, Min Namkung |
1996-02-20 |