Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11097499 | Polyaniline/carbon nanotube sheet nanocomposites | Jae-Woo Kim, Emilie J. Siochi, Kristopher E. Wise, John W. Connell, Yi Lin +1 more | 2021-08-24 |
| 10464271 | Polyaniline/carbon nanotube sheet nanocomposites | Jae-Woo Kim, Emilie J. Siochi, Kristopher E. Wise, John W. Connell, Yi Lin +1 more | 2019-11-05 |
| 10139345 | Magnetic and Raman based method for process control during fabrication of carbon nanotube based structures | Jae-Woo Kim, Godfrey Sauti, Emilie J. Siochi, Phillip A. Williams | 2018-11-27 |
| 8717012 | Eddy current probe for surface and sub-surface inspection | John W. Simpson | 2014-05-06 |
| 8164328 | Eddy current system and method for crack detection | John W. Simpson | 2012-04-24 |
| 8147920 | Controlled deposition and alignment of carbon nanotubes | Jan M. Smits, JoAnne L. Patry, Anthony Watkins, Jeffrey D. Jordan | 2012-04-03 |
| 7901611 | Method for predicting and optimizing system parameters for electrospinning system | — | 2011-03-08 |
| 7491428 | Controlled deposition and alignment of carbon nanotubes | Jan M. Smits, JoAnne L. Ingram, Anthony Watkins, Jeffrey D. Jordan | 2009-02-17 |
| 7278324 | Carbon nanotube-based sensor and method for detection of crack growth in a structure | Jan M. Smits, Marlen T. Kite, Thomas C. Moore, JoAnne L. Ingram, Anthony Watkins +1 more | 2007-10-09 |
| 7129467 | Carbon nanotube based light sensor | Jan M. Smits, Jeffrey D. Jordan, Anthony Watkins, JoAnne L. Ingram | 2006-10-31 |
| 6888346 | Magnetoresistive flux focusing eddy current flaw detection | Min Namkung, John W. Simpson | 2005-05-03 |
| 6190589 | Fabrication of molded magnetic article | Robert G. Bryant, Min Namkung, Robert L. Fox | 2001-02-20 |
| 6054210 | Molded magnetic article | Robert G. Bryant, Min Namkung, James P. Fulton, Robert L. Fox | 2000-04-25 |
| 5942894 | Radially focused eddy current sensor for detection of longitudinal flaws in metallic tubes | John W. Simpson, James P. Fulton, Shridhar Champaknath Nath, Ronald G. Todhunter, Min Namkung | 1999-08-24 |
| 5847562 | Thickness gauging of single-layer conductive materials with two-point non linear calibration algorithm | James P. Fulton, Min Namkung, John W. Simpson, Shridhar Champaknath Nath | 1998-12-08 |
| 5698977 | Eddy current method for fatigue testing | John W. Simpson, James P. Fulton, Ronald G. Todhunter, Min Namkung, Shridhar Champaknath Nath | 1997-12-16 |
| 5648721 | Rotating flux-focusing eddy current probe for flaw detection | James P. Fulton, Shridhar Champaknath Nath, John W. Simpson, Min Namkung | 1997-07-15 |
| 5617024 | Flux focusing eddy current probe | John W. Simpson, C. Gerald Clendenin, James P. Fulton, Ronald G. Todhunter, Min Namkung +1 more | 1997-04-01 |