Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12034000 | Double IO pad cell including electrostatic discharge protection scheme with reduced latch-up risk | Michael A. Stockinger | 2024-07-09 |
| 11862625 | Area-efficient ESD protection inside standard cells | Michael A. Stockinger, Vasily Vladimirovich Korolev, Irina Yuryevna Bashkirova, Olga Olegovna Sibagatullina | 2024-01-02 |
| 9553446 | Shared ESD circuitry | Alex P. Gerdemann, Melanie Etherton, James W. Miller, Robert S. Ruth, Michael A. Stockinger | 2017-01-24 |
| 9478529 | Electrostatic discharge protection system | James W. Miller, Melanie Etherton, Alex P. Gerdemann, Jonathan M. Phillippe, Robert S. Ruth | 2016-10-25 |
| 9076656 | Electrostatic discharge (ESD) clamp circuit with high effective holding voltage | Melanie Etherton, Alex P. Gerdemann, James W. Miller, Robert S. Ruth, Michael A. Stockinger | 2015-07-07 |
| 8330231 | Transistor having gate dielectric protection and structure | Da Zhang, Ning Liu | 2012-12-11 |
| 8254186 | Circuit for verifying the write enable of a one time programmable memory | Alexander B. Hoefler | 2012-08-28 |
| 7927989 | Method for forming a transistor having gate dielectric protection and structure | Da Zhang, Ning Liu | 2011-04-19 |
| 7741183 | Method of forming a gate dielectric | Tien Ying Luo, Ning Liu | 2010-06-22 |
| 7612619 | Phase detector device and method thereof | Leo Mathew, Sriram Kalpat | 2009-11-03 |
| 7439791 | Temperature compensation device and method thereof | Sriram Kalpat, Leo Mathew | 2008-10-21 |
| 7279997 | Voltage controlled oscillator with a multiple gate transistor and method therefor | Sriram Kalpat, Leo Mathew, Michael A. Sadd, Hector Sanchez | 2007-10-09 |
| 7274247 | System, method and program product for well-bias set point adjustment | Gregory Hall Ward, Mahbub Rashed | 2007-09-25 |
| 7215268 | Signal converters with multiple gate devices | Sriram Kalpat, Leo Mathew | 2007-05-08 |
| 5822218 | Systems, methods and computer program products for prediction of defect-related failures in integrated circuits | Kelvin F. Poole | 1998-10-13 |