Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8324915 | Increasing thermal isolation of a probe card assembly | Kevin Yasumura, Timothy Blomgren, Jacob Chang | 2012-12-04 |
| 8271773 | Configurable field device for use in process automation systems | Udo Grittke, Armin Wernet, Roland Dieterle, Axel Humpert, Dietmar Frühauf +3 more | 2012-09-18 |
| 7932743 | Sequentially configurable programmable integrated circuit | Rodney Stewart, Juan J. Noguera Serra, Robert P. Esser, Jürgen Becker, Oliver Sander +2 more | 2011-04-26 |
| 7924035 | Probe card assembly for electronic device testing with DC test resource sharing | — | 2011-04-12 |
| 7893700 | Configuration of shared tester channels to avoid electrical connections across die area boundary on a wafer | Stefan Zschiegner | 2011-02-22 |