Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7893700 | Configuration of shared tester channels to avoid electrical connections across die area boundary on a wafer | Michael W. Huebner | 2011-02-22 |
| 5654971 | Electronic circuit or board tester and method of testing an electronic device | Winfried Heitele | 1997-08-05 |