Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 7893700 | Configuration of shared tester channels to avoid electrical connections across die area boundary on a wafer | Michael W. Huebner | 2011-02-22 | $2,854,000 |
| 5654971 | Electronic circuit or board tester and method of testing an electronic device | Winfried Heitele | 1997-08-05 | $41,401,000 |