DM

David J. Maloney

ET Ekc Technology: 9 patents #3 of 87Top 4%
DN Dupont Air Products Nanomaterials: 3 patents #7 of 33Top 25%
SU Simon Fraser University: 1 patents #100 of 251Top 40%
Overall (All Time): #387,304 of 4,157,543Top 10%
13
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
7528098 Semiconductor process residue removal composition and process Wai Mun Lee, Katy Ip, Xuan-Dung Dinh 2009-05-05
7314823 Chemical mechanical polishing composition and process Robert J. Small, Laurence McGhee, Maria Peterson 2008-01-01
7276180 Chemical mechanical polishing composition and process Robert J. Small, Laurence McGhee, Maria Peterson 2007-10-02
7157415 Post etch cleaning composition for dual damascene system Catherine M. Peyne, Shihying Lee, Wai Mun Lee, Leslie W. Arkless 2007-01-02
7074640 Method of making barrier layers Wai Mun Lee, Paul Roman, Michael Fury 2006-07-11
7033942 Chemical mechanical polishing composition and process Robert J. Small, Laurence McGhee, Maria Peterson 2006-04-25
6825156 Semiconductor process residue removal composition and process Wai Mun Lee, Katy Ip, Xuan-Dung Dinh 2004-11-30
6696363 Method of and apparatus for substrate pre-treatment Wai Mun Lee, Paul Roman, Michael Fury, Ross Hill, Clifford Henderson +1 more 2004-02-24
6635186 Chemical mechanical polishing composition and process Robert J. Small, Laurence McGhee, Maria Peterson 2003-10-21
6566276 Method of making electronic materials Wai Mun Lee, Paul Roman, Michael Fury, Ross Hill 2003-05-20
6417112 Post etch cleaning composition and process for dual damascene system Catherine M. Peyne, Shihying Lee, Wai Mun Lee, Leslie W. Arkless 2002-07-09
6313039 Chemical mechanical polishing composition and process Robert J. Small, Laurence McGhee, Maria Peterson 2001-11-06
6117783 Chemical mechanical polishing composition and process Robert J. Small, Laurence McGhee, Maria Peterson 2000-09-12