CP

Catherine M. Peyne

ET Ekc Technology: 2 patents #23 of 87Top 30%
Overall (All Time): #2,152,844 of 4,157,543Top 55%
2
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
7157415 Post etch cleaning composition for dual damascene system David J. Maloney, Shihying Lee, Wai Mun Lee, Leslie W. Arkless 2007-01-02
6417112 Post etch cleaning composition and process for dual damascene system David J. Maloney, Shihying Lee, Wai Mun Lee, Leslie W. Arkless 2002-07-09