Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| RE50540 | Method for inspecting a sample using an assembly comprising a scanning electron microscope and a light microscope | Nalan Liv Hamarat, Pieter Kruit | 2025-08-19 |
| 11742173 | Integrated optical and charged particle inspection apparatus | Sander Vincent DEN HOEDT | 2023-08-29 |
| 10651009 | Method for inspecting a sample using an assembly comprising a scanning electron microscope and a light microscope | Nalan Liv Hamarat, Pieter Kruit | 2020-05-12 |
| 10132753 | Method and apparatus for determining a density of fluorescent markers in a sample | Pieter Kruit | 2018-11-20 |
| 9715992 | Integrated optical and charged particle inspection apparatus | Pieter Kruit, Nalan Liv, Aernout Christiaan Zonnevylle | 2017-07-25 |
| 9378921 | Integrated optical and charged particle inspection apparatus | Aernout Christiaan Zonnevylle, Pieter Kruit, Angela Carolina Narváez-González | 2016-06-28 |
| 8895921 | Inspection apparatus and replaceable door for a vacuum chamber of such an inspection apparatus and a method for operating an inspection apparatus | Pieter Kruit, Aernout Christiaan Zonnevylle | 2014-11-25 |