Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10903042 | Apparatus and method for inspecting a sample using a plurality of charged particle beams | Pieter Kruit, Yan Ren | 2021-01-26 |
| 10453649 | Apparatus and method for inspecting a sample using a plurality of charged particle beams | Pieter Kruit, Yan Ren | 2019-10-22 |
| 9715992 | Integrated optical and charged particle inspection apparatus | Jacob Pieter Hoogenboom, Pieter Kruit, Nalan Liv | 2017-07-25 |
| 9607806 | Charged particle multi-beam apparatus including a manipulator device for manipulation of one or more charged particle beams | Pieter Kruit | 2017-03-28 |
| 9378921 | Integrated optical and charged particle inspection apparatus | Jacob Pieter Hoogenboom, Pieter Kruit, Angela Carolina Narváez-González | 2016-06-28 |
| 8895921 | Inspection apparatus and replaceable door for a vacuum chamber of such an inspection apparatus and a method for operating an inspection apparatus | Pieter Kruit, Jacob Pieter Hoogenboom | 2014-11-25 |
| 8294117 | Multiple beam charged particle optical system | Pieter Kruit | 2012-10-23 |