Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| RE50540 | Method for inspecting a sample using an assembly comprising a scanning electron microscope and a light microscope | Jacob Pieter Hoogenboom, Pieter Kruit | 2025-08-19 |
| 10651009 | Method for inspecting a sample using an assembly comprising a scanning electron microscope and a light microscope | Jacob Pieter Hoogenboom, Pieter Kruit | 2020-05-12 |