Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12417894 | Method and manipulation device for handling samples | — | 2025-09-16 |
| 12306121 | Method and apparatus for inspecting a sample by means of multiple charged particle beamlets | Andries Pieter Johan EFFTING | 2025-05-20 |
| 11742173 | Integrated optical and charged particle inspection apparatus | Jacob Pieter Hoogenboom | 2023-08-29 |