AE

Andries Pieter Johan EFFTING

DB Delmic Ip B.V.: 3 patents #1 of 6Top 20%
📍 Delft, NL: #243 of 1,192 inventorsTop 25%
Overall (All Time): #1,331,348 of 4,157,543Top 35%
3
Patents All Time

Issued Patents All Time

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
12387905 Apparatus and method for detecting one or more scanning charged particle beams Lenard Maarten Voortman 2025-08-12
12306121 Method and apparatus for inspecting a sample by means of multiple charged particle beamlets Sander Vincent DEN HOEDT 2025-05-20
12123841 Apparatus and method for projecting an array of multiple charged particle beamlets on a sample 2024-10-22