Issued Patents All Time
Showing 1–25 of 37 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7765443 | Test systems and methods for integrated circuit devices | Ahmed Syed | 2010-07-27 |
| 7761751 | Test and diagnosis of semiconductors | — | 2010-07-20 |
| 7454678 | Scan stream sequencing for testing integrated circuits | Jamie S. Cullen | 2008-11-18 |
| 7336066 | Reduced pin count test method and apparatus | — | 2008-02-26 |
| 7222280 | Diagnostic process for automated test equipment | Rodolfo E. Garcia | 2007-05-22 |
| 7212941 | Non-deterministic protocol packet testing | Angarai T. Sivaram, Howard Maassen | 2007-05-01 |
| 7171598 | Tester system having a multi-purpose memory | Jamie S. Cullen | 2007-01-30 |
| 7143326 | Test system algorithmic program generators | Daniel Fan, Kris Sakaitani | 2006-11-28 |
| 7113886 | Circuit and method for distributing events in an event stream | — | 2006-09-26 |
| 7093177 | Low-jitter clock for test system | Paolo Dalla Ricca | 2006-08-15 |
| 7035755 | Circuit testing with ring-connected test instrument modules | Michael Jones, Robert Whyte, Jamie S. Cullen, Naveed Zaman, Yann Gazounaud +1 more | 2006-04-25 |
| 7017091 | Test system formatters configurable for multiple data rates | — | 2006-03-21 |
| 6940271 | Pin electronics interface circuit | — | 2005-09-06 |
| 6937006 | Pin electronics interface circuit | — | 2005-08-30 |
| 6928387 | Circuit and method for distributing events in an event stream | — | 2005-08-09 |
| 6859902 | Method and apparatus for high speed IC test interface | Wajih Dalal, Masashi Shimanouchi, Robert J. Glenn, II | 2005-02-22 |
| 6748564 | Scan stream sequencing for testing integrated circuits | Jamie S. Cullen | 2004-06-08 |
| 6622107 | Edge placement and jitter measurement for electronic elements | — | 2003-09-16 |
| 6501706 | Time-to-digital converter | — | 2002-12-31 |
| 6285963 | Measuring signals in a tester system | — | 2001-09-04 |
| 6128754 | Tester having event generation circuit for acquiring waveform by supplying strobe events for waveform acquisition rather than using strobe events specified by the test program | Egbert Graeve | 2000-10-03 |
| 6081484 | Measuring signals in a tester system | — | 2000-06-27 |
| 6025736 | Fast reprogrammable logic with active links between cells | Madhukar B. Vora | 2000-02-15 |
| 6014764 | Providing test vectors with pattern chaining definition | Egbert Graeve, Teck Chiau Chew | 2000-01-11 |
| 6002268 | FPGA with conductors segmented by active repeaters | Paul T. Sasaki, Madhukar B. Vora | 1999-12-14 |