Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7296195 | Bit synchronization for high-speed serial device testing | — | 2007-11-13 |
| 7143326 | Test system algorithmic program generators | Daniel Fan, Burnell G. West | 2006-11-28 |
| 7039841 | Tester system having multiple instruction memories | Jamie S. Cullen | 2006-05-02 |