Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7454678 | Scan stream sequencing for testing integrated circuits | Burnell G. West | 2008-11-18 |
| 7171598 | Tester system having a multi-purpose memory | Burnell G. West | 2007-01-30 |
| 7039841 | Tester system having multiple instruction memories | Kris Sakaitani | 2006-05-02 |
| 7035755 | Circuit testing with ring-connected test instrument modules | Michael Jones, Robert Whyte, Naveed Zaman, Yann Gazounaud, Burnell G. West +1 more | 2006-04-25 |
| 6748564 | Scan stream sequencing for testing integrated circuits | Burnell G. West | 2004-06-08 |