Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6859902 | Method and apparatus for high speed IC test interface | Masashi Shimanouchi, Robert J. Glenn, II, Burnell G. West | 2005-02-22 |
| 6661836 | Measuring jitter of high-speed data channels | Daniel Rosenthal | 2003-12-09 |
| 6553522 | Valuation of tester accuracy | Song Miao | 2003-04-22 |