TD

Thomas J. Dunn

CI Corning Incorporated: 12 patents #424 of 3,867Top 15%
AN Anvik: 9 patents #5 of 23Top 25%
EP Epsco: 2 patents #1 of 8Top 15%
NASA: 2 patents #707 of 3,881Top 20%
CE Combustion Engineering: 2 patents #141 of 732Top 20%
HT Helix Technology: 2 patents #39 of 132Top 30%
DD Dentsply Research And Development: 1 patents #84 of 167Top 55%
HA Hazeltine: 1 patents #38 of 95Top 40%
Overall (All Time): #90,246 of 4,157,543Top 3%
37
Patents All Time

Issued Patents All Time

Showing 25 most recent of 37 patents

Patent #TitleCo-InventorsDate
10871369 Systems for and methods of measuring photomask flatness with reduced gravity-induced error John Weston Frankovich, Robert Dennis Grejda, Christopher Lee, Matthew Ronald Millecchia, Yoshihiro Nakamura 2020-12-22
10488176 Edge registration for interferometry Paul Francis Michaloski 2019-11-26
9829310 Interferometric roll-off measurement using a static fringe pattern Alexander Timothy Bean, Christopher Lee, Mark Joseph Tronolone 2017-11-28
9651358 Grazing-incidence interferometer with dual-side measurement capability using a common image plane Joshua Monroe Cobb, John Weston Frankovich 2017-05-16
9513214 Skewed sectional measurement of striated glass Paul G. Dewa, Robert Dennis Grejda, Christopher Lee 2016-12-06
8531677 Frequency-shifting interferometer with selective data processing Christopher Lee, Mark Joseph Tronolone 2013-09-10
8526008 Interferometer with paraboloidal illumination and imaging optic and tilted imaging plane Joshua Monroe Cobb, John Weston Frankovich 2013-09-03
8218586 Littman configured frequency stepped laser Jack Weston Frankovich, Christopher Lee 2012-07-10
7916763 Current driven frequency-stepped radiation source and methods thereof Christopher Lee, Mark Joseph Tronolone 2011-03-29
7268887 Overlapping common-path interferometers for two-sided measurement Andrew W. Kulawiec, Mark Joseph Tronolone, Joseph Marron 2007-09-11
7259860 Optical feedback from mode-selective tuner Joseph Marron, Nestor O. Farmiga, Andrew W. Kulawiec 2007-08-21
7209499 Mode-selective frequency tuning system Nestor O. Farmiga, Andrew W. Kulawiec, Joseph Marron 2007-04-24
6781699 Two-wavelength confocal interferometer for measuring multiple surfaces Andrew W. Kulawiec, Mark Joseph Tronolone 2004-08-24
6312134 Seamless, maskless lithography system using spatial light modulator Kanti Jain, Jeffrey M. Hoffman 2001-11-06
6304316 Microlithography system for high-resolution large-area patterning on curved surfaces Kanti Jain, Nestor O. Framiga 2001-10-16
6201597 Apparatus for projection patterning of large substrates using limited-travel precision x-y stage Nestor O. Farmiga, Kanti Jain 2001-03-13
6149856 Ultraviolet-based, large-area scanning system for photothermal processing of composite structures Marc Zemel 2000-11-21
6040552 High-speed drilling system for micro-via pattern formation, and resulting structure Kanti Jain, Nestor O. Farmiga, Carl S. Weisbecker, Carl Kling 2000-03-21
6018383 Very large area patterning system for flexible substrates Nestor O. Farmiga, Marc Zemel, Carl S. Weisbecker, Kanti Jain 2000-01-25
5933216 Double-sided patterning system using dual-wavelength output of an excimer laser 1999-08-03
5897986 Projection patterning of large substrates using limited-travel x-y stage Nestor O. Farmiga, Kanti Jain 1999-04-27
5730070 Apparatus for introducing gas recirculation to control steam temperature in steam generation systems Robert Kunkel 1998-03-24
5654939 Retrievable volumetric/planar acoustic array apparatus Craig V. Bruengger, Thomas P. Bourgault, Richard Meyer 1997-08-05
5555089 Absolute distance measuring interferometry using multi-pass resonant cavity referenced to a stabilized laser source Dharmesh G. Panchal 1996-09-10
5502563 Transporter for optical spectrum analyzer in alignment system Kanti Jain 1996-03-26