Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9097612 | Integrated wavefront sensor and profilometer | Paul Murphy, Jon Fleig | 2015-08-04 |
| 7286238 | Feature isolation for frequency-shifting interferometry | Christopher Lee, Mark Joseph Tronolone | 2007-10-23 |
| 7268887 | Overlapping common-path interferometers for two-sided measurement | Mark Joseph Tronolone, Thomas J. Dunn, Joseph Marron | 2007-09-11 |
| 7268889 | Phase-resolved measurement for frequency-shifting interferometry | Joseph Marron, Don McClimans, Mark Joseph Tronolone | 2007-09-11 |
| 7259860 | Optical feedback from mode-selective tuner | Joseph Marron, Nestor O. Farmiga, Thomas J. Dunn | 2007-08-21 |
| 7209499 | Mode-selective frequency tuning system | Nestor O. Farmiga, Joseph Marron, Thomas J. Dunn | 2007-04-24 |
| 6781699 | Two-wavelength confocal interferometer for measuring multiple surfaces | Thomas J. Dunn, Mark Joseph Tronolone | 2004-08-24 |
| 6757067 | Fringe pattern discriminator for grazing incidence interferometer | Christopher Lee, Mark Joseph Tronolone | 2004-06-29 |
| 6456384 | Moiré interferometer with overlapping illumination and imaging systems | Dag Lindquist, James Edward Platten, Paul G. Dewa | 2002-09-24 |
| 5923425 | Grazing incidence interferometry for measuring transparent plane-parallel plates | Paul G. Dewa | 1999-07-13 |
| 5909282 | Interferometer for measuring thickness variations of semiconductor wafers | — | 1999-06-01 |
| 5793488 | Interferometer with compound optics for measuring cylindrical objects at oblique incidence | James Edward Platten, John H. Bruning | 1998-08-11 |
| 5777738 | Interferometric measurement of absolute dimensions of cylindrical surfaces at grazing incidence | — | 1998-07-07 |
| 5719676 | Diffraction management for grazing incidence interferometer | Paul Francis Michaloski | 1998-02-17 |