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Dag Lindquist — 2 Patents

CIChapman Instruments: 1 patents #8 of 13Top 65%
TRTropel: 1 patents #10 of 19Top 55%
Penfield, NY: #362 of 745 inventorsTop 50%
New York: #49,169 of 115,490 inventorsTop 45%
Overall (All Time): #1,709,992 of 4,157,543Top 45%
2 Patents All Time
Dag Lindquist has been granted 2 US patents while listed as an inventor at Chapman Instruments. The first was granted in 2000 and the most recent in September 2002. Dag Lindquist ranks #1,709,992 of 4,157,543 US inventors in our database (top 41.1%). Patent records list Dag Lindquist in Penfield, NY, US.

Issued Patents All Time

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6456384 Moiré interferometer with overlapping illumination and imaging systems Andrew W. Kulawiec, James Edward Platten, Paul G. Dewa 2002-09-24
6157450 Automated optical surface profile measurement system Silvio P. Marchese-Ragona, Robert Bryant, Matthew E. Seelig, Donald P. McClimans, Edward J. Merritt, Jr. +2 more 2000-12-05

Frequent Collaborators

Robert Bryant1 shared
Andrew W. Kulawiec1 shared
Donald P. McClimans1 shared
Edward J. Merritt, Jr.1 shared
Paul G. Dewa1 shared
John E. Stephan1 shared

Nearby-Ranked Inventors

Leonard Mattheis2
Yiqi SHI2
Roberto DiCecco2
Haoneng Xu2
Emily Chew2
So Young Bae2
Julian Alexander Georgi2
Yoshihiro Asahara2
Assaf Ariel2