Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6456384 | Moiré interferometer with overlapping illumination and imaging systems | Andrew W. Kulawiec, James Edward Platten, Paul G. Dewa | 2002-09-24 |
| 6157450 | Automated optical surface profile measurement system | Silvio P. Marchese-Ragona, Robert Bryant, Matthew E. Seelig, Donald P. McClimans, Edward J. Merritt, Jr. +2 more | 2000-12-05 |