Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6157450 | Automated optical surface profile measurement system | Robert Bryant, Matthew E. Seelig, Dag Lindquist, Donald P. McClimans, Edward J. Merritt, Jr. +2 more | 2000-12-05 |
| 5986753 | Wafer holding and orienting fixture for optical profilometry | Matthew E. Seelig | 1999-11-16 |