Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7283256 | Method and apparatus for measuring wafer thickness | Thomas Bristow, Shu Wang | 2007-10-16 |
| 6157450 | Automated optical surface profile measurement system | Silvio P. Marchese-Ragona, Robert Bryant, Matthew E. Seelig, Dag Lindquist, Donald P. McClimans +2 more | 2000-12-05 |