John E. Stephan — 2 Patents at Chapman Instruments

John E. Stephan has been granted 2 US patents while listed as an inventor at Chapman Instruments. The first was granted in 2000 and the most recent in October 2007. John E. Stephan ranks #1,709,992 of 4,157,543 US inventors in our database (top 41.1%). Patent records list John E. Stephan in Rochester, NY, US.

Issued Patents All Time

Showing 1–2 of 2 patents

Patent #	Title	Co-Inventors	Date
7283256	Method and apparatus for measuring wafer thickness	Thomas Bristow, Shu Wang	2007-10-16
6157450	Automated optical surface profile measurement system	Silvio P. Marchese-Ragona, Robert Bryant, Matthew E. Seelig, Dag Lindquist, Donald P. McClimans +2 more	2000-12-05

John E. Stephan — 2 Patents

Issued Patents All Time

Patent Widget