Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7283256 | Method and apparatus for measuring wafer thickness | Shu Wang, John E. Stephan | 2007-10-16 |
| 7280232 | Method and apparatus for measuring wafer thickness | Shu Wang | 2007-10-09 |