TB

Thomas Bristow

CI Chapman Instruments: 2 patents #1 of 13Top 8%
Overall (All Time): #2,161,815 of 4,157,543Top 55%
2
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
7283256 Method and apparatus for measuring wafer thickness Shu Wang, John E. Stephan 2007-10-16
7280232 Method and apparatus for measuring wafer thickness Shu Wang 2007-10-09