Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9097612 | Integrated wavefront sensor and profilometer | Andrew W. Kulawiec, Paul Murphy | 2015-08-04 |
| 7433057 | Method for accurate high-resolution measurements of aspheric surfaces | Paul Murphy, Dragisha Miladinovic, Greg Forbes, Gary Devries | 2008-10-07 |
| 7173691 | Method for calibrating the geometry of a multi-axis metrology system | Paul Murphy, Greg Forbes | 2007-02-06 |
| 5724137 | Fringe pattern discriminator for interferometer using diffraction gratings | Mark Joseph Tronolone | 1998-03-03 |
| 5416586 | Method of testing aspherical optical surfaces with an interferometer | Mark Joseph Tronolone, Chunsheng Huang, John H. Bruning | 1995-05-16 |
| 5349434 | Method of measuring artifact taper | Mark Joseph Tronolone, Chunsheng Huang | 1994-09-20 |