Issued Patents All Time
Showing 76–89 of 89 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8441653 | Apparatus and method for batch non-contact material characterization | Dong Seung Lee, Mikhail Belousov, Eric A. Armour | 2013-05-14 |
| 8198605 | Apparatus and method for batch non-contact material characterization | Dong Seung Lee, Mikhail Belousov, Eric A. Armour | 2012-06-12 |
| 8092599 | Movable injectors in rotating disc gas reactors | Piero Sferlazzo, Alexander I. Gurary, Eric A. Armour, Steve Ting | 2012-01-10 |
| 8022372 | Apparatus and method for batch non-contact material characterization | Dong Seung Lee, Mikhail Belousov, Eric A. Armour | 2011-09-20 |
| 5606572 | Integration of laser with photodiode for feedback control | Stanley E. Swirhun | 1997-02-25 |
| 5577064 | Integration of laser with photodiode for feedback control | Stanley E. Swirhun | 1996-11-19 |
| 5525810 | Self calibrating solid state scanner | Jack L. Jewell, Robert P. Bryan, Winston S. Fu, Stan E. Swirhun | 1996-06-11 |
| 5500540 | Wafer scale optoelectronic package | Jack L. Jewell, Stan E. Swirhun, Robert P. Bryan | 1996-03-19 |
| 5302847 | Semiconductor heterostructure having a capping layer preventing deleterious effects of As-P exchange | Rajaram Bhat, Maria J. S. P. Brasil, Robert E. Nahory, Maria C. Tamargo | 1994-04-12 |
| 5246878 | Capping layer preventing deleterious effects of As--P exchange | Rajaram Bhat, Maria J. S. P. Brasil, Robert E. Nahory, Maria C. Tamargo | 1993-09-21 |
| 5206706 | Alignment of an ellipsometer or other optical instrument using a diffraction grating | — | 1993-04-27 |
| 5091320 | Ellipsometric control of material growth | David E. Aspnes | 1992-02-25 |
| 4885186 | Method for preparation of silicate glasses of controlled index of refraction | Brian G. Bagley | 1989-12-05 |
| 4835057 | Glass fibers having organosilsesquioxane coatings and claddings | Brian G. Bagley, Charles R. Kurkjian | 1989-05-30 |