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David E. Aspnes — 22 Patents

THTherma-Wave: 13 patents #5 of 60Top 9%
BRBell Communications Research: 3 patents #103 of 628Top 20%
BLBell Telephone Laboratories: 3 patents #167 of 1,445Top 15%
NUNorth Carolina State University: 1 patents #675 of 1,607Top 45%
ATAT&T: 1 patents #10,636 of 18,772Top 60%
Kla-Tencor: 1 patents #1,404 of 2,049Top 70%
Watchung, NJ: #13 of 176 inventorsTop 8%
New Jersey: #3,574 of 69,400 inventorsTop 6%
Overall (All Time): #189,202 of 4,157,543Top 5%
22 Patents All Time
David E. Aspnes has been granted 22 US patents while listed as an inventor at Therma-Wave. The first was granted in 1982 and the most recent in April 2008. David E. Aspnes ranks #189,202 of 4,157,543 US inventors in our database (top 4.6%). Patent records list David E. Aspnes in Watchung, NJ, US.

Issued Patents All Time

Showing 1–22 of 22 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
7355708 Normal incidence rotating compensator ellipsometer — 2008-04-08 $11,813,000
7173700 Normal incidence rotating compensator ellipsometer — 2007-02-06 $842,000
6831743 Broadband spectroscopic rotating compensator ellipsometer Jon Opsal 2004-12-14 $1,517,000
6650415 Broadband spectroscopic rotating compensator ellipsometer Jon Opsal 2003-11-18 $6,382,000
6449043 Broadband spectroscopic rotating compensator ellipsometer Jon Opsal 2002-09-10 $716,000
6411385 Thin film optical measurement system and method with calibrating ellipsometer Jon Opsal, Jeffrey T. Fanton 2002-06-25 $5,333,000
6411381 Method of reducing noise generated by arc lamps in optical systems employing slits Martin Ebert 2002-06-25
6320657 Broadband spectroscopic rotating compensator ellipsometer Jon Opsal 2001-11-20 $3,004,000
6304326 Thin film optical measurement system and method with calibrating ellipsometer Jon Opsal, Jeffrey T. Fanton 2001-10-16 $7,402,000
6181421 Ellipsometer and polarimeter with zero-order plate compensator Joanne Law 2001-01-30 $10,065,000
6134012 Broadband spectroscopic rotating compensator ellipsometer Jon Opsal 2000-10-17 $14,538,000
5973787 Broadband spectroscopic rotating compensator ellipsometer Jon Opsal 1999-10-26
5900939 Thin film optical measurement system and method with calibrating ellipsometer Jon Opsal, Jeffrey T. Fanton 1999-05-04
5877859 Broadband spectroscopic rotating compensator ellipsometer Jon Opsal 1999-03-02
5798837 Thin film optical measurement system and method with calibrating ellipsometer Jon Opsal, Jeffrey T. Fanton 1998-08-25
5277747 Extraction of spatially varying dielectric function from ellipsometric data — 1994-01-11 $8,875,000
5091320 Ellipsometric control of material growth William E. Quinn 1992-02-25 $5,927,000
4931132 Optical control of deposition of crystal monolayers Rajaram Bhat, Etienne G. Colas, Leigh T. Florez, James P. Harbison, Amabrose A. Studna 1990-06-05 $2,762,000
4492466 Cylindrical grating monochromator for synchrotron radiation — 1985-01-08
4380490 Method of preparing semiconductor surfaces Ambrose A. Studna 1983-04-19 $36,259,000
4357179 Method for producing devices comprising high density amorphous silicon or germanium layers by low pressure CVD technique Arthur C. Adams, Brian G. Bagley 1982-11-02 $13,249,000
4332833 Method for optical monitoring in materials fabrication Brian G. Bagley 1982-06-01 $12,888,000

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