Issued Patents All Time
Showing 26–30 of 30 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9653255 | Scanning particle microscope having an energy selective detector system | — | 2017-05-16 |
| 9530613 | Focusing a charged particle system | Steven R. Rogers, Rainer Knippelmeyer, Thomas Kemen, Nissim Elmaliah | 2016-12-27 |
| 9324537 | Charged particle inspection method and charged particle system | Thomas Kemen, Rainer Knippelmeyer | 2016-04-26 |
| 9263233 | Charged particle multi-beam inspection system and method of operating the same | Dirk Zeidler, Rainer Knippelmeyer, Thomas Kemen, Mario Muetzel, Nissim Elmaliah +1 more | 2016-02-16 |
| 9099282 | Focusing a charged particle imaging system | Steven R. Rogers, Rainer Knippelmeyer, Thomas Kemen, Nissim Elmaliah | 2015-08-04 |