KY

Kazuo Yamazaki

Canon: 81 patents #221 of 19,416Top 2%
SO Sony: 22 patents #1,822 of 25,231Top 8%
MI Mitutoyo: 17 patents #37 of 721Top 6%
UN Unknown: 17 patents #282 of 83,584Top 1%
OK Okuma: 15 patents #6 of 233Top 3%
MC Mori Seiki Co.: 12 patents #2 of 217Top 1%
Sumitomo Electric Industries: 9 patents #3,076 of 21,551Top 15%
KS Kabushiki Kaisha Mori Seiki Seisakusho: 5 patents #1 of 19Top 6%
HI Hitachi: 5 patents #7,555 of 28,497Top 30%
IN Intel: 5 patents #7,174 of 30,777Top 25%
DC Dmg Mori Co.: 4 patents #17 of 217Top 8%
DC Dmg Mori Seiki Co.: 4 patents #7 of 142Top 5%
Ngk Spark Plug Co.: 3 patents #540 of 1,594Top 35%
MC Mitsumi Electric Co.: 3 patents #259 of 935Top 30%
University of California: 1 patents #8,022 of 18,278Top 45%
TO Toshiba: 1 patents #1,121 of 2,688Top 45%
AS Advanced Research For Manufacturing Systems: 1 patents #2 of 5Top 40%
TI Texas Instruments: 1 patents #7,357 of 12,488Top 60%
DE Denso: 1 patents #6,940 of 11,792Top 60%
EM Elpida Memory: 1 patents #419 of 692Top 65%
FL Fujitsu Automation Limited: 1 patents #23 of 36Top 65%
MT Mti: 1 patents #9 of 26Top 35%
NC Nippon Graphite Industries Co.: 1 patents #5 of 15Top 35%
NC Nkk Co.: 1 patents #579 of 1,173Top 50%
OC Oji Paper Co.: 1 patents #173 of 423Top 45%
PS Ps4 Luxco S.A.R.L.: 1 patents #127 of 276Top 50%
RT Renesas Technology: 1 patents #1,991 of 3,337Top 60%
SS Sumitomo Wiring Systems: 1 patents #1,603 of 2,615Top 65%
TA Takenaka: 1 patents #67 of 199Top 35%
Tdk: 1 patents #2,493 of 3,796Top 70%
📍 Yokohama, CA: #14 of 287 inventorsTop 5%
Overall (All Time): #5,530 of 4,157,543Top 1%
158
Patents All Time

Issued Patents All Time

Showing 126–150 of 158 patents

Patent #TitleCo-InventorsDate
6552562 Current detecting apparatus and its control method Tamiji Nagai, Tamon Ikeda 2003-04-22
6512961 Method and apparatus for collecting operation event logs in NC machining Yasushi Fukaya, Sadayuki Matsumiya, Masayoshi Uneme 2003-01-28
6505092 NC machining support method and device Yasushi Fukaya, Sadayuki Matsumiya, Masayoshi Uneme 2003-01-07
6502007 Optimization method and device of NC program in NC machining Masao Kanamoto, Yasushi Fukaya, Sadayuki Matsumiya 2002-12-31
6479392 Fabrication method for semiconductor integrated circuit devices and semiconductor integrated circuit device Shinji Kuniyoshi, Kousuke Kusakari, Takenobu Ikeda, Masahiro Tadokoro 2002-11-12
6462972 Power source apparatus for providing a power source in a standby mode and a pulse generating apparatus Tamiji Nagai, Tamon Ikeda 2002-10-08
6452820 Power supplying apparatus and method having a primary side insulated from a secondary side Tamiji Nagai, Tamon Ikeda 2002-09-17
6400998 Generation of measurement program in NC machining and machining management based on the measurement program Sadayuki Matsumiya, Naoki Morita, Yasushi Fukaya 2002-06-04
6401004 Method and device for analyzing NC program for NC machining Naoki Morita, Sadayuki Matsumiya, Yasushi Fukaya 2002-06-04
6373724 Power supply apparatus Tamiji Nagai, Tamon Ikeda 2002-04-16
6286055 Error correction apparatus for NC machine tool Kyoichi Yamamoto, Sadayuki Matsumiya, Naoki Morita 2001-09-04
6266572 Apparatus for generating a numerical control command according to cut resistance value and cut torque value of machining simulation Kyoichi Yamamoto, Naoki Morita, Sadayuki Matsumiya 2001-07-24
6223095 Numeric control command generator and method Yasushi Fukaya, Naoki Morita, Sadayuki Matsumiya 2001-04-24
6128788 Water closet and nursing bed device with same 2000-10-10
6124700 Charging method, charging equipment, and integrated circuit Tamiji Nagai, Kazunori Ozawa, Kuniharu Suzuki 2000-09-26
6057609 Auxiliary power supply apparatus Tamiji Nagai, Sumio Iwase 2000-05-02
6040584 Method and for system for detecting damaged bills Jiancheng Liu 2000-03-21
5798033 Process for preparing porous metallic body and porous metallic body for battery electrode substrate prepared therefrom Takafumi Uemiya, Hitoshi Tsuchida, Masayuki Furukawa, Tadashi Dohi 1998-08-25
5794113 Simultaneous synthesis and densification by field-activated combustion Zuhair A. Munir, In-Jin Shon 1998-08-11
5757496 Method of surface roughness measurement using a fiber-optic probe 1998-05-26
5744964 Method and apparatus for electrical test of wiring patterns formed on a printed circuit board Morishiro Sudo, Masaru Ishijima 1998-04-28
5410410 Non-contact type measuring device for measuring three-dimensional shape using optical probe Hideki Aoyama 1995-04-25
5223349 Copper clad aluminum composite wire Kazunao Kudo 1993-06-29
5218868 Signal processing method for magnetic-ultrasonic wall thickness measuring apparatus Yoshioki Komiya, Mitsuo Sueyoshi, Takaaki Ogiwara 1993-06-15
5200366 Semiconductor device, its fabrication method and molding apparatus used therefor Tomio Yamada, Hiroi Oka, Atsusi Nakamura, Kunihiko Nishi, Kouzi Koizumi +1 more 1993-04-06