SM

Sadayuki Matsumiya

MI Mitutoyo: 97 patents #1 of 721Top 1%
UN Unknown: 13 patents #477 of 83,584Top 1%
OK Okuma: 12 patents #9 of 233Top 4%
MC Mori Seiki Co.: 8 patents #6 of 217Top 3%
KS Kabushiki Kaisha Mori Seiki Seisakusho: 5 patents #1 of 19Top 6%
MC Mitutoyo Mfg. Co.: 2 patents #30 of 118Top 30%
Overall (All Time): #14,888 of 4,157,543Top 1%
99
Patents All Time

Issued Patents All Time

Showing 1–25 of 99 patents

Patent #TitleCo-InventorsDate
11234670 Measuring X-ray CT apparatus and tomographic image generating method Hidemitsu Asano, Masato Kon 2022-02-01
10551184 Measuring head Tomoyuki Miyazaki, Shuichi Kamiyama, Hideyuki Arai 2020-02-04
D848867 Display device for hardness tester Yoshiro Asano, Masaru Kawazoe, Fumihiko Koshimizu, Shigeru Ohtani, Yu Sugai +1 more 2019-05-21
D848882 Hardness tester Yoshiro Asano, Masaru Kawazoe, Fumihiko Koshimizu, Shigeru Ohtani, Yu Sugai 2019-05-21
10295337 Surface texture measuring apparatus Shuichi Kamiyama, Hidemitsu Asano, Hiroshi Sakai, Hiromu MAIE, Yoshihiko Takahashi +2 more 2019-05-21
D848883 Hardness tester Yoshiro Asano, Masaru Kawazoe, Fumihiko Koshimizu, Shigeru Ohtani, Yu Sugai 2019-05-21
D847676 Hardness tester Yoshiro Asano, Masaru Kawazoe, Fumihiko Koshimizu, Shigeru Ohtani, Yu Sugai 2019-05-07
D847674 Hardness tester Yoshiro Asano, Masaru Kawazoe, Fumihiko Koshimizu, Shigeru Ohtani, Yu Sugai 2019-05-07
D847675 Hardness tester Yoshiro Asano, Masaru Kawazoe, Fumihiko Koshimizu, Shigeru Ohtani, Yu Sugai 2019-05-07
10197382 Chromatic confocal sensor Kenji Okabe, Koji Kubo, Nobuya Kaneko 2019-02-05
10190996 Method and device for controlling rotary table Hidemitsu Asano, Masato Kon 2019-01-29
10161743 Measuring probe and measuring probe system Kazuhiko Hidaka 2018-12-25
10113851 Probe head rotating mechanism Yoshikazu Ooyama, Hayato Kusama, Hitoshi Ohta 2018-10-30
D829261 Variable focal length lens Kenji Okabe, Tatsuya Nagahama, Masaki Okayasu, Shigeru Ohtani, Yu Sugai +1 more 2018-09-25
D827459 Probe for remote coordinate measuring machine Takeshi Kawabata, Hidekazu Sano, Yu Sugai, Shigeru Ohtani 2018-09-04
D825557 Wireless communication device Atsuya Niwano, Yu Sugai, Shigeru Ohtani, Jun Odake 2018-08-14
D821393 Wireless communication device Atsuya Niwano, Yu Sugai, Shigeru Ohtani, Jun Odake 2018-06-26
10001358 Measuring probe and measuring probe system Kazuhiko Hidaka, Nobuyuki Hama, Tatsuki Nakayama 2018-06-19
D819631 Connection device for communication Atsuya Niwano, Yu Sugai, Shigeru Ohtani, Jun Odake 2018-06-05
D806586 Image measuring device Yu Sugai, Shigeru Ohtani, Kenji Iwamoto, Ryohei Kanno, Atsushi Hattori +1 more 2018-01-02
D806585 Image measuring device Yu Sugai, Shigeru Ohtani, Kenji Iwamoto, Ryohei Kanno, Atsushi Hattori +1 more 2018-01-02
D805409 Optical measurement head for coordinate measurement Yu Sugai, Shigeru Ohtani, Kentaro Nemoto, Toshihisa Takai, Osamu Saito 2017-12-19
D792251 Digital measuring gauge Shigeru Ohtani, Yuji Oura 2017-07-18
D790379 Digital dial gauge Shigeru Ohtani, Kenji Iwamoto, Yasuhiro Tsujimoto, Atsuya Niwano 2017-06-27
D783424 Image measuring device Yu Sugai, Shigeru Ohtani, Kenji Iwamoto, Ryohei Kanno, Atsushi Hattori +1 more 2017-04-11