Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11573190 | Calibration method for X-ray measuring device | Masato Kon, Seiji Sasaki, Jyota Miyakura | 2023-02-07 |
| 11435560 | Lens substrate stacking position calculating apparatus and program | Kazuhiko Hidaka, Jyota Miyakura | 2022-09-06 |
| 11344276 | Calibration method of x-ray measuring device | Masato Kon, Seiji Sasaki, Jyota Miyakura | 2022-05-31 |
| 11346660 | Calibration method of x-ray measuring device | Masato Kon, Seiji Sasaki, Jyota Miyakura | 2022-05-31 |
| 11040443 | Rotational angle limiting mechanism | Tomohiro Arizono | 2021-06-22 |
| 10295337 | Surface texture measuring apparatus | Sadayuki Matsumiya, Shuichi Kamiyama, Hidemitsu Asano, Hiroshi Sakai, Yoshihiko Takahashi +2 more | 2019-05-21 |