HA

Hidemitsu Asano

MI Mitutoyo: 17 patents #37 of 721Top 6%
Overall (All Time): #252,338 of 4,157,543Top 7%
18
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11510643 Calibration method and apparatus for measurement X-ray CT apparatus, measurement method and apparatus using the same, and measurement X-ray CT apparatus Masato Kon 2022-11-29
11333619 Measurement X-ray CT apparatus Seiji Sasaki, Nobuyuki Nakazawa, Hisayoshi Sakai, Masato Kon 2022-05-17
11262319 Measuring X-ray CT apparatus and production work piece measurement method Masato Kon 2022-03-01
11234670 Measuring X-ray CT apparatus and tomographic image generating method Sadayuki Matsumiya, Masato Kon 2022-02-01
11041818 Dimensional X-ray computed tomography system and CT reconstruction method using same Yusuke Goto 2021-06-22
11037337 Method and apparatus for generating measurement plan for measuring X-ray CT Kozo Ariga, Gyokubu Cho, Masato Kon 2021-06-15
10753887 X-ray CT measuring apparatus and interference prevention method thereof Kozo Ariga, Gyokubu Cho, Masato Kon 2020-08-25
10618220 Object-forming machine, cross-section measurement apparatus, and cross-section measurement method Gyokubu Cho, Masato Kon 2020-04-14
10343334 Object-forming machine, cross-section measurement apparatus, and cross-section measurement method Gyokubu Cho, Masato Kon 2019-07-09
10295337 Surface texture measuring apparatus Sadayuki Matsumiya, Shuichi Kamiyama, Hiroshi Sakai, Hiromu MAIE, Yoshihiko Takahashi +2 more 2019-05-21
10190996 Method and device for controlling rotary table Sadayuki Matsumiya, Masato Kon 2019-01-29
10102631 Edge detection bias correction value calculation method, edge detection bias correction method, and edge detection bias correcting program Hiroyuki Yoshida, Akira Takada, Makoto Kaieda, Gyokubu Cho, Koichi Komatsu +3 more 2018-10-16
8891090 Light-interference measuring apparatus Tatsuya Nagahama, Koji Kubo, Jyota Miyakura 2014-11-18
8681341 Shape measuring method and shape measuring apparatus Tomonori Goto, Jyota Miyakura, Takeshi Saeki 2014-03-25
8680428 Slit width adjusting device and microscope laser processing apparatus Makoto Uwada, Makoto Kaieda 2014-03-25
8316553 Coordinate measuring machine Sadayuki Matsumiya 2012-11-27
8008610 Illumination light quantity setting method in image measuring instrument Sadayuki Matsumiya 2011-08-30
7420588 Measuring method, measuring system and storage medium Yasuo Sugita, Koichi Komatsu, Sadayuki Matsumiya 2008-09-02